Rapid thin film characterization

Rapid thin film characterization

TOOLS & TECHNIQUES UPDATE Small-angle X-ray scattering system Bruker AXS’ SuperSpeedSolutions X-ray diffraction systems combine the high-speed, one-d...

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Small-angle X-ray scattering system Bruker AXS’ SuperSpeedSolutions X-ray diffraction systems combine the high-speed, one-dimensional VÅNTEC-1™ detector with the high-power Turbo-X-ray Source, which has up to 18 kW of power and is fully integrated into the D8 platform. In combination with the VÅNTEC-1 detector, or with the HISTAR™ detection system, the Turbo-X-ray Source allows timeresolved X-ray diffraction experiments. In combination with NANOSTAR™, it creates SuperSpeedSolutions small-angle X-ray scattering systems (SAXS) for nanostructure analysis.

Catalysis cell for atom probes

Contact: www.bruker-axs.de

Contact: www.madcitylabs.com

Oxford nanoScience has launched a new reaction cell that can be mounted on to its three-dimensional atom probe (3DAP) system for investigating catalytic reactions between process gases and metal surfaces. Gas inlet and outlet ports, a heater, and differential pumping allow samples to be heated to 873 K in process gases such as NO, CO, SO2, or O2 (introduced at flow rates of up to 1 l/hr) before transfer to the 3DAP. 3DAP analyses reveal the exact sites of gas species adsorption on the atomic surfaces. Atom maps of the sample can be reconstructed, with each dot representing a single atom from the specimen, and color coded to show its chemical identity. Contact: www.oxfordnanoscience.com

CVD system for CNT-FEDs First Nano has launched a next-generation EasyTube™ chemical vapor deposition (CVD) system for producing nanotubes or nanowires directly on glass substrates for field-emission display (FED) technology, application research, and development. The EasyTube FED aims to allow the transition from research into prototyping and manufacturing for the commercialization of nanomaterials-based FED devices and technologies. Contact: www.firstnano.com

Rapid thin film characterization Jobin Yvon’s PZ2000 Laser Ellipsometer delivers rapid, high-accuracy characterization of thin and ultrathin structures, and exhibits subangstrom standard deviation over one year for National Institute of Standards and Technology (NIST) reference wafers. Options include 10 µm x 30 µm spot size for characterizing patterned samples. A reflectometer option allows characterization from angstrom to 50 µm thickness. The use of up to three wavelengths eliminates film thickness ambiguity and increases the sample information needed for the analysis of absorbing films. Contact: www.jobinyvon.com


December 2004

Slimline nanopositioner Mad City Labs’s Nano-LP200 nanopositioning system for use in microscopy has a standard travel of 200 µm x 200 µm x 200 µm and provides nanometer accuracy under closed loop control. Its slim 20 mm profile allows integration into existing optical and atomic force microscopes and its central aperture enables the admission of probes or objective lenses. The Nano-LP200 features fully integrated piezoresistive sensors for absolute position measurement.

Surface imaging on the move Schaefer Technologie’s Nanosurf® Mobile S is a versatile, portable surface imaging microscope that makes three-dimensional measurements with nanometer resolution on areas up to 110 µm x 110 µm in size. It can image structures too small for profilers and is suited to roughness measurement, morphological inspection, tribology, and failure and defect analysis. A high-resolution scan head can measure angstromscale atomic steps and roughness, or a large scan head can investigate corrugations larger than a few microns and with significant sample curvatures. Both heads can be used on a wide variety of samples, from ceramics to butterfly wings, without sample preparation.

Upgrading AFM to DPN NanoInk’s Nano-R Upgrade transforms Pacific Nanotechnology’s Nano-R system from an atomic force microscope (AFM) into a complete NSCRIPTOR system, a high-performance patterning tool for use with the dip-pen nanolithography (DPN) process. The DPN process enables nanoscale patterns of molecular ‘ink’ to be written on a substrate using a scanning probe microscope tip. NSCRIPTOR’s three-step workflow (design, deposit, inspect) is enabled by (i) InkCAD™ software, which provides ink-writing calibration and nanoscale alignment; (ii) environmental control, with both temperature and humidity stabilization; and (iii) multipen technology for scaling up the patterning process of molecular deposition. Multiprobe technology turns the NSCRIPTOR into a scalable, rapid prototyping tool for nanofabrication and nanomaterials. Contact: www.nanoink.net

The new ceramic drive system on Physik Instrumente’s Nexline® linear actuator combines subnanometer resolution, high forces, and long travel ranges. In step mode, motion is continuous in steps from <20 nm to 2 µm in size. In analog mode, resolution is less than 1 nm, travel range is typically 2 µm, and settling time for a full-range move is less than 10 ms. Nexline is suited to ultraprecise positioning in astronomy, optics, IC manufacture, and high-energy physics.

High throughput spectrometer WITec’s new UHTS 300 Raman spectrometer is an optional component for its CRM 200 Confocal Raman Microscopy system. Ultrahigh throughput enables nearly twice as much transmission as conventional spectrometers. With the UHTS 300, the acquisition time for a single Raman spectrum per image pixel is far less than 100 ms. Chemical information can be obtained with a lateral resolution of 200 nm and a spectral resolution of 0.02 wavenumbers.

Contact: www.physikinstrumente.de

Contact: www.WITec.de

Contact: www.nanosurf.com

Ultraprecise positioning